Manufacturer: Hioki
Model No.: 1240
URL: http://www.hioki.cn
- Test Speed Steps: 40 steps/sec
- Min. Probe Interval Pitch: 0.2mm
- Probing Accuracy: +/- 100 microns
- Travel Repeatability Accuracy: +/- 50 microns
- Reduces running cost
- Testing Functions: Open/short circuits, component range capacitor, resistor, inductor, diode, polar chips and etc.
- Individual measurement includes resistance, capacitance, inductance, diode and etc.
- Hiscan Option: IC leads for poor contact with low electrical conductivity
Manufacturer: Hioki
Model No.: 1240
URL: http://www.hioki.cn
- Test Speed Steps: 40 steps/sec
- Min. Probe Interval Pitch: 0.2mm
- Probing Accuracy: +/- 100 microns
- Travel Repeatability Accuracy: +/- 50 microns
- Reduces running cost
- Testing Functions: Open/short circuits, component range capacitor, resistor, inductor, diode, polar chips and etc.
- Individual measurement includes resistance, capacitance, inductance, diode and etc.
- Hiscan Option: IC leads for poor contact with low electrical conductivity
